Scientists have identified a new type of defect as the most common source of disorder in on-surface synthesized graphene nanoribbons, a novel class of carbon-based materials that may prove extremely ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Researchers have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the transfer of quantum information ...