SAN FRANCISCO — Nextest Systems Corp. has rolled out its latest line of automatic test equipment (ATE) that is designed for use in high-speed flash-memory testing. The Magnum Grande, integrated ...
TOKYO--(BUSINESS WIRE)--Kioxia Corporation, a world leader in memory solutions, has successfully developed a prototype of a large-capacity, high-bandwidth flash memory module essential for large-scale ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback